Abstract
New thermal imaging techniques of remarkable sensitivity have recently been developed which permit the nondestructive examination of electronic components. Applications include the imaging of surface and subsurface defects and the characterisation of doping and other electronic properties in semiconductors
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.