Abstract
The gate-controlled quantum capacitance and the channel resistance play an important role in the performance of graphene field-effect transistors (GFETs). This paper experimentally verifies that the output phase of the graphene field-effect transistor changes under the influence of quantum capacitance and the channel resistance, which are controlled by the gate voltage. This phenomenon is theoretically analyzed, and a model is established to simulate the phase shift. The obtained simulation results of the model are in good agreement with the experimental results. This work reveals the influence of gate voltage variation on the phase characteristics of GFETs and provides a research basis for the application of GFETs in phase shifter and the establishment of the small-signal model.
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