Abstract
SummaryThis paper reports a phase noise analysis in a differential Armstrong oscillator circuit topology in CMOS technology. The analytical expressions of phase noise due to flicker and thermal noise sources are derived and validated by the results obtained through SpectreRF simulations for oscillation frequencies of 1, 10, and 100 GHz. The analysis captures well the phase noise of the oscillator topology and shows the impact of flicker noise contribution as the major effect leading to phase noise degradation in nano‐scale CMOS LC oscillators. Copyright © 2016 John Wiley & Sons, Ltd.
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