Phase contrast coherence microscopy based on transverse scanning

Abstract

We present what we believe to be a novel approach to measuring optical path length differences with a precision of a few nanometers. The instrument is based on transverse scanning or en-face optical coherence tomography. Owing to the fast motion of the scanning beam over the sample, excellent phase stability in the transverse direction is achieved. Hence, phase changes caused by the varying optical path lengths within the sample arm occur with high frequency in the fast scanning direction. These changes are well separated from the rather slow phase changes introduced by jitter within the interferometer and can therefore be measured. The en-face imaging speed of the instrument is 40 fps (520 x 200 pixels). The measured precision of the method to detect small changes in optical path lengths was approximately 3 nm.