Abstract
We present what we believe to be a novel approach to measuring optical path length differences with a precision of a few nanometers. The instrument is based on transverse scanning or en-face optical coherence tomography. Owing to the fast motion of the scanning beam over the sample, excellent phase stability in the transverse direction is achieved. Hence, phase changes caused by the varying optical path lengths within the sample arm occur with high frequency in the fast scanning direction. These changes are well separated from the rather slow phase changes introduced by jitter within the interferometer and can therefore be measured. The en-face imaging speed of the instrument is 40 fps (520 x 200 pixels). The measured precision of the method to detect small changes in optical path lengths was approximately 3 nm.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
