Abstract
ABSTRACTYMnO3 thin films were prepared based on a chemical solution deposition route. Their structure was studied as a function of the annealing temperature using X-ray diffraction, Raman spectroscopy, and electron backscatter diffraction. For annealing temperatures above 850°C the films, though crystallizing predominantly in a P63cm hexagonal structure, exhibit a thin Pnma orthorhombic phase close to the film-substrate interface. It is shown that the residual orthorhombic structure is associated with a substrate induced strain state, characterized by an expansion in the in-plane a direction, and a compression in the out of plain c direction.
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