Abstract
The objective of this work is to determine the dielectric permittivity of two SiC ceramic matrix composites. These composites are reinforced with NicalonSiCfibers and SCS6SiC fibers (SiCf / SiC) and have different volume fractions. The results obtained show that the dielectric property depends on the volume fraction and the frequency. Composites with high volume fractions have better dielectric properties than others. The values of the real and imaginary part of the complex permittivity decrease with frequency increase in the Ku-band. Moreover, the imaginary part takes negative values.
Highlights
The knowledge of the dielectric permittivity of composite materials is important for several applications [1, 2, 3], in telecommunications, industry and the design of radarabsorbing materials (RAM) [4]
The relaxation polarization is reinforced, resulting in an increase in the corresponding relaxation loss and improvement of the imaginary part of the complex permittivity. These results indicate that the evolution of the complex permittivity of the two samples studied depends on the frequency.The curves (5a) and (6a) of the real parts of the permittivity for the two composites in the Ku band are decreasing as a function of the frequency, as well as the values of the imaginary part
We adopted the transmission/reflection method to determine the complex permittivity of two ceramic composites with Nicalon SiC fiber and SCS6SiC fiber in the Ku-band
Summary
The knowledge of the dielectric permittivity of composite materials is important for several applications [1, 2, 3], in telecommunications, industry and the design of radarabsorbing materials (RAM) [4]. SiC Ceramic matrix composites reinforced by silicon carbide SiCfibers, such as Nicalonfibers, have become important in various applications [5]. They are used for the reinforcement of composite materials in many practical applications and for microwave absorption at high temperature [6, 7]. The Transmission/Reflection (T/R) technique is one of the most adopted methods to characterize materials in the wide frequency range [8]. This technique is based on the use of rectangular waveguides
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