Performances of niobium planar nanointerferometers as a function of the temperature: a comparative study

Abstract

The growing interest in the development of nano-superconducting quantum interference devices (nanoSQUIDs) and their applications in nanoscience demands a deep study of these ultra-high-sensitivity nanodevices. In this paper, the main features of niobium planar nanointerferometers as a function of the temperature have been investigated. In particular, two types of nanodevices have been realized and studied: one based on nanobridges and the other on sub-micron Josephson tunnel junctions (JTJs). The nanobridge-based nanointerferometer, fabricated by electron beam lithography (EBL), consists of a sub-micrometric loop (effective area of 0.5 μm2), interrupted by two Dayem nanobridges having a width and length of 50 and 80 nm respectively. The JTJs-based nanointerferometer has two Nb/Al-AlOx/Nb SNIS (superconductor/normal-insulator/superconductor) junctions with an area of 0.09 μm2, connected by a rectangular loop (1 μm × 0.2 μm), and realized by the three-dimensional focused ion beam (3D FIB) sculpting technique. For both nanodevices, measurements of current–voltage characteristics and critical current versus external magnetic flux have been performed at operating temperatures ranging from 4.2 to 1.2 K. The critical current modulation depths, magnetic flux to current transfer factor (current responsivity) and magnetic flux resolution as a function of the temperature have been evaluated for both nanosensors. Furthermore, measurements of the voltage–magnetic flux characteristics and the spectral density of magnetic flux noise have been performed at T = 4.2 K.