Abstract
The ion barrier film of microchannel plate (MCP) plays a most important role in the third generation low-light level image intensifier to prevent the feedback of positive ions, protect the photocathode and prolong the operating life of image intensifier. In this paper, the influence of high-temperature degassing on the performances of the ion barrier film and the MCP itself were investigated by the experiments. The high-temperature degassing and the corresponding measurement system of MCP were shown, the detailed technology process was given, and the changes of the ion barrier film's morphology and the MCP's electrical performance after high-temperature degassing were compared. For a MCP with an ion barrier film, it was found that the electron gain decreased, the bulk resistance increased, the grain size of the ion barrier film increased and the dead-voltage decreased after high-temperature degassing.
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