Abstract

Oxide semiconductor-based heterojunction bipolar transistors are widely applicable in flexible, printable, and cost-effective circuit applications. Among earth-abundant metal oxides, zinc oxide and copper oxide inherently show n-type and p-type characteristics, respectively, and their electronic properties can be easily modified during the fabrication process. Accordingly, a planar-type HBT can be achieved by low-temperature growth of the metal-oxide layers on a flexible substrate without the need for further sophisticated processes. In this paper, a double heterojunction bipolar transistor (DHBT) comprised of ZnO layers serving as the emitter and collector regions, along with the CuO layer functioning as the base area is presented. Simulation results demonstrate that the proposed all-metal oxide transistor based on p-CuO/n-ZnO heterojunction enjoys low power consumption owing to the low threshold voltage. High-frequency characterization and DC analysis of the proposed NPN configuration are carried out using the ATLAS/SILVACO package. Our findings reveal that at the base-emitter voltage of 0.55 V, the current gain factor of the device reaches 155, which is larger than those reported in the literature. Furthermore, an ideality factor at the base-emitter voltage of 0.7 V was obtained for the collector-base and emitter-base junctions equal to 1.5 and 1.2, respectively.

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