Abstract
Tamper-evident seals are commonly used for non-proliferation applications. A properly engineered tamper-evident seal enables the detection of unauthorized access to a protected item or a secured zone. Tamper-evident seals must be susceptible to malicious attacks. These attacks should cause irreversible and detectable damage to the seals. At the same time, tamper-evident seals must demonstrate robustness to environmental changes in order to minimize false-positive and false-negative rates under real operating conditions. The architecture of the tamper-evident seal presented in this paper features a compressive sampling (CS) acquisition scheme, which provides the seal with a means for self- authentication and self-state of health awareness. The CS acquisition scheme is implemented using a micro-controller unit (MCU) and an array of resistors engraved on a graphite oxide (GO) film. CS enables compression and encryption of messages sent from the seal to the remote reader in a non-bit sensitive fashion. As already demonstrated in our previous work through the development of a simulation framework, the CS non-bit sensitive property ensures satisfactory reconstruction of the encrypted messages sent back to the reader when the resistance values of the resistor array are simultaneously affected by modest changes. This work investigates the resistive behavior of the reduced GO film to changes in temperature and humidity when tested in an environmental chamber. The goal is to characterize the humidity and temperature range for reliable operation of a GO-based seal.
Published Version
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