Abstract
A performance analysis and comparison of two one-transistor/one-magnetic tunnel junction (1T/1MTJ)-based logic gates is presented. The energy consumption as well as the reliability of different Boolean logic functions utilizing the two circuit topologies are studied and the adequacy of their employment for specific non-volatile logic applications is discussed. It has been shown that the implication logic design exhibits a more reliable behavior compared to the reprogrammable logic design featuring conventional Boolean logic operations like (N)AND and (N)OR. Although the comparison between the two error optimized logic gate types shows that the fundamental logic operations with the reprogrammable gates require less energy than with the IMP gates, the situation reverses for more complex Boolean logic operations.
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