Abstract
Perfection of NaNO3 single crystals grown by axial vibrational control technique in the Czochralski configuration (AVC-CZ) by submerging an oscillating baffle into the melt under the crystal was studied. The characteristics of AVC-CZ grown crystals were analyzed by micro-Raman technique, X-ray structural analysis and chemical dislocation etching. For the AVC-CZ grown NaNO3 single crystals the structure sensitive properties of high-quality were demonstrated.
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