Abstract
In this paper, we propose a new discrete-time model which relates uniform samples and K-th order nonuniform (KONU) samples. Typically, such situations may occur in practice where the sampling rates of analog-to-digital converters (ADCs) in a cluster of sensors may be different. This paper also outlines a digital signal processing approach to reconstructing uniform samples from the nonuniform samples produced by time interleaving analog-to-digital converters (TI-ADCs) with different sampling rates and time-mismatches.
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