Abstract
This paper presents a novel technique used to prepare samples in cross-section using ion beam technology, MCS Perfect Edge™ and Perfect Edge 3D™. The resulting surfaces are deformation-free allowing high magnification and high resolution analysis of subtle nanometer scale features and material changes across a representative sample size (mm's rather than microns). This unique process can be used to prepare most material types and combinations of materials including metals, ceramics, plastics, organics, as well as samples combining hard and soft, thick and thin material layers with zero deformation. True sample structure and key forensic evidence is revealed allowing accurate analysis of early stage failure mechanisms and therefore diagnosis of root-cause. MCS Ltd have also developed a novel process which enables the same deformation-free cross-section whilst retaining access to the sample surface allowing high magnification and resolution analysis in three dimensions, MCS Perfect Edge 3D™. This process has transformed failure analysis capabilities by enabling direct correlation of surface appearance and crosssection condition.
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