Abstract
The collective effect of injection charges constructed in a dot array using scanning probe microscopy (SPM) in BaTiO3 ferroelectric thin films was investigated with Kelvin force microscopy (KFM). Unexpected charges were observed in the SPM tip paths where poling bias was zero. The analysis of the array with different poling biases shows that the collective effect of the injection charges in the dot array induced a potential difference between film and tip, which in turn injected unexpected charges. The calculated potential difference distribution along the tip’s paths correlates well with KFM images of the unexpected charges.
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