Abstract
Identification of relativistic charged particles by means of fine sampling d E/d X measurements with a longitudinal drift chamber has been studied. Using a fast-sampling ADC (25 MHz), d E/d X was measured in a 1.4 mm gas thickness over an electron drift space of 51 mm. For the simulated 1 m long tracks of pions and electrons of 500 MeV/ c, a particle separation of 10 σ−12 σ has been obtained, where σ is the r.m.s. resolution of the d E/d X measurement. This result with fine sampling is better by a factor of 1.7 compared to the d E/d X measurement with 21 mm sampling thickness. Further improvement achievable by reducing the correlation between neighbouring samples and simplification of electronics by use of the δ-ray clipping method are also discussed.
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