Abstract
By combining coherent Fourier scatterometry (CFS) with synthetic optical holography (SOH) we show that the sensitivity of detection of isolated nanoparticles on surfaces can be substantially increased. This improvement is a result of the boost in the signal at the detector due to the added reference beam, and the reduction of background noise caused by the electronics. We demonstrate an improvement of sensitivity of about 4 dB for the case of detection of a 60 nm polystyrene latex (PSL) particle on a silicon wafer at the wavelength of 633 nm (∼ λ/10).
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