Abstract
Participation of Defects Localized at Heterointerfaces and Extended Defects in the Degradation of Nitride-Based Light-Emitting Devices
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https://doi.org/10.1134/s0030400x24020176
Journal: Optics and Spectroscopy | Publication Date: Feb 1, 2024 |
Participation of Defects Localized at Heterointerfaces and Extended Defects in the Degradation of Nitride-Based Light-Emitting Devices
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