Abstract
A substantial sensitivity improvement is predicted for partial pressure gauges using triple focusing mass spectrometer geometries. The simultaneous stigmatic and energy focusing is obtained by locating the plates of a plane condenser in the magnetic pole gap. Two ways to reach this purpose are indicated: a homogeneous magnetic field with oblique beam entry and exit or a ‘wedge’ magnet with normal field boundaries. A complete second-order ion optical description is given for both cases. Numerical values for the aberration coefficients are given for some particular cases. The resolution increase is estimated with the usual ion source parameters in a ‘wedge’ field design, compared with a stigmatic but single focusing mass spectrometer the main path radius being the same.
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