Abstract
In this paper, we present a thorough analysis of parasitic coupling effects between different electrodes for a 3D Sequential Integration circuit example comprising stacked devices. More specifically, this study is performed for a Back-Side Illuminated, 4T–APS, 3D Sequential Integration pixel with both its photodiode and Transfer Gate at the bottom tier and the other parts of the circuit on the top tier. The effects of voltage bias and 3D inter-tier contacts are studied by using TCAD simulations. Coupling-induced electrical parameter variations are compared against variations due to temperature change, revealing that these two effects can cause similar levels of readout error for the top-tier readout circuit. On the bright side, we also demonstrate that in the case of a rolling shutter pixel readout, the coupling effect becomes nearly negligible. Therefore, we estimate that the presence of an inter-tier ground plane, normally used for electrical isolation, is not strictly mandatory for Monolithic 3D pixels.
Highlights
User-interactive applications are continuously emerging and driving the electronics industry towards the adoption of heterogeneous technologies in the sense that the analog sensing parts are integrated together with digital processing parts
We present a thorough analysis of the possible coupling effects in the realization of a Back-Side Illuminated (BSI) 4–Transistor (4T) pixel with its diode and Transfer Gate (TG) on the bottom tier and the rest of its circuitry on the top tier of a 3DSI process, as an example of parasitic coupling analysis in a 3DSI circuit
By varying the gate tionality of the 3DSI pixel, we investigated the impact of the capacitive coupling of the voltage placed at its thenormal bottom operation tier on each top device
Summary
User-interactive applications are continuously emerging and driving the electronics industry towards the adoption of heterogeneous technologies in the sense that the analog sensing parts are integrated together with digital processing parts. Image Sensor (CIS), because it is a circuit that requires the heterogeneous integration of different system parts: a photon-to-electron converter (photodiode) functions as the sensing interface in the pixel array and the readout part consists of an analog circuit that transmits information from the pixel to a digital circuit for processing. Low Temperature (LT) devices have been successfully fabricated and optimized for both low-voltage (LV) [5] and high-voltage (HV) [8] applications Using such LT devices, Coudrain et al [9] have investigated the feasibility of a 3DSI Back-Side Illuminated (BSI) CIS with miniaturized pixels, achieving a photodiode area increase by 44% for a 1.4 μm pitch.
Sign-in/Register to view highlights & summary Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
