Abstract
The planar integrated EMI filter has been widely used because of its small size and good high-frequency characteristics. During the production process, if the electrical parameters of the integrated LC structure can be accurately identified, it will help improve the high-frequency characteristics of the filter. However, this identification problem is a multi-peak problem, which can easily fall into a local optimal solution. Based on the Feature Selective Validation method, this paper proposes an improved Immune Algorithm. The proposed method keeps changing the fitness function in the iterative process to avoid the algorithm falling into the local optimal solution. Finally, comparing with the measured impedance characteristic curve, it is verified that the proposed method is more accurate than the common Immune Algorithm.
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