Abstract

Modeling photovoltaic (PV) modules is fundamental for analyzing their efficiency and performance under different operating conditions. Generally, photovoltaic module modeling is based on a suitable equivalent circuit and a set of parameters representing the PV module's properties. Defining these parameters is not a trivial task, as they are usually not included in the technical documentation of the module. Therefore, the need to find suitable values for the model parameters becomes imperative. In this paper, we will test and compare two methods of extracting single-diode model (SDM) parameters: analytical and numerical, under standard test conditions (STC conditions). We examined the performance of six techniques: three analytical and three numerical. Except for Saleem technique, which tends to underestimate the I-V and P-V curves in the MPP zone, the results demonstrated that both approaches (analytical and iterative/numerical) are valid and accurate for predicting the I-V and P-V curves under STC conditions.

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