PALS study on the defect structure of yttria-stabilized zirconia

Abstract

Powders of stabilized ZrO 2–8 mol% Y 2O 3 (YSZ) have been obtained by mechanical milling in zirconia vials. The samples were characterized by X-ray diffraction (XRD). Positron annihilation lifetime (PALS) measurements were performed to investigate the lattice defects originated by the incorporation of yttria and those mechanically induced. The XRD results indicate the formation of tetragonal YSZ solid solution. PALS results indicate that positron trapping occurs at different kinds of defects such as vacancy-like defects, grain boundary and associated defects.