Abstract
The superconducting transition temperature of Sb/Sn thin films was measured as a function of the normal sheet resistance. The samples were prepared by alternate deposition of Sb and Sn. When the thickness of Sn layer and the total layer number were kept constant, the normal sheet resistance increased with the increase of Sb layer thickness. The normal sheet resistance of the samples ranged from 20 to 100(Ω). The transition temperature decreased proportionally with the increase of the normal sheet resistance. This result shows that there exists the pair-breaking mechanism dependent on the normal sheet resistance in the films. As the normal sheet resistance relates to the disorder in the films, it is suggested that the disorder contributes to the pair-breaking mechanism.
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