Abstract
Fluctuation-induced conductivity (FIC) above the superconducting transition temperature was investigated for thin aluminium films with a deposition of Ni. The measured FIC is well explained by the traditional fluctuation theory. The pair breaking parameter δ increases with increasing Ni layer thickness and approaches a constant value if the mass average thickness of the Ni layer becomes larger than approximately one nm. The well-known experimental relation between δ and the normal sheet resistance {ie1355-01}, δ = a + {ie1355-02} is fulfilled for different Ni layer thicknesses. With the knowledge of δ the magnetic scattering times could be determined.
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