Abstract
Theoretical calculations have been performed for the temperature stability of the amorphous TeO2/128degY-X LiNbO3 structure. The phase velocity, electromechanical coupling coefficient and temperature coefficient of delay (TCD) have been calculated. Amorphous TeO2 film has been found as an attractive negative TCD over-layer that can yield a zero TCD when combined with a positive TCD material such as 128 deg Y-X LiNb03. And in comparison to conventional SiO2 over-layer, the amorphous TeO2's film reaches the zero TCD under a much less thickness. The effect of the temperature coefficients of amorphous TeO2's elastic constants on the structure's TCD has also been studied. We find the temperature coefficients of amorphous TeO2 Cn have a more dominant effect on TCD.
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