Abstract
AbstractIn this paper, we proposed two types of integrated scan driver circuits using only n‐channel zinc‐oxide (ZnO) thin film transistors (TFTs). One is the scan driver circuit for low‐power consumption and the other scan driver is for robustness to threshold voltage and mobility variation. The proposed scan driver for low‐power consumption is embedding level shifter and its power consumption was 1.4 mW. The scan driver for robustness used positive feedback circuits as pull‐up devices. By simulation results, the proposed scan driver has robustness in the frequency, temperature, and process variation compared to conventional scan drivers. Also, two proposed scan drivers have advantages of full swing output range from VDD to VSS.
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