A scan driver including light emission control integrated by metal-oxide thin-film transistors

Abstract

This paper presents a new scan driver including a light emission control module, which is fabricated by metal oxide thin-film transistors (TFTs) with back channel etched structures. The proposed scan driver employs the capacitor coupling effect and two-step-resetting method to output SCAN and EM signals simultaneously. Therefore, there is no need to design the scan driver circuit and the light emission control circuit separately, which saves the resources of peripheral driving signals and area of TFT integrated circuits. Thirty stages of the proposed scan driver are fabricated on a glass substrate to verify its function. Experimental results show that each stage can output full-swing waveforms for SCAN and EM signals, which have little distortion and exhibit good stability with a 10 us pulse width. The measured power consumption per stage of the proposed scan driver is 85 µW at a clock frequency of 33.4 kHz.