Abstract
The objective of this study was to develop a method for accurately evaluating the quality of splicing seams in tiled transparent MicroLED displays, replacing subjective human observation with a quantitative indicator. The study utilized the validated Structural Similarity (SSIM) index method, which enabled precise guidance in the production process and established common measurement standards for defining splicing seam quality. This study would significantly contribute to the advancement of panel technology development by providing a standardized and objective evaluation approach for assessing splicing seam quality.
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