Abstract
Abstract A comparative study of Kelvin Probe (KP) surface work function analysis of p-type CuO thin films to its nanowires is presented. Thin films were prepared by RF magnetron sputtering and nanowires were grown by thermal oxidation of grown thin films. The structural characterization was carried out by SEM and micro-Raman spectrophotometry. Finally, Surface work function variations of both materials were recorded while exposing them to some oxidizing and reducing gases, looking for a comparison between their gas sensing performances. The collected results were analyzed and compared to improve our understanding about sensing mechanisms involved in these kinds of p-type materials.
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