Abstract
An inverted or p-down InGaN/GaN multiple quantum wells (MQW) light-emitting diode (LED) structure is studied. The crystalline quality of the quantum wells is comparable to that of the n-down structure by using a Si or In co-doped GaN:Mg layer underneath the active layer. It was found that I–V characteristics can be improved by insertion of a tunnel layer, either a 3D growth GaN:Mg layer or an AlGaN/GaN superlattice layer. The feasibility of such a structure for practical application is also evaluated by luminescence measurement.
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