Abstract
The failure mode of electronic paper display under different temperature and humidity conditions is studied in this paper. Nine high temperature and high humidity conditions are designed for the verification, it is found that the Arrehenius accelerated life model and the Peck accelerated life model are not suitable for the lifetime prediction of Microcapsule Electrophoretic Display Device. Therefore, based on these two accelerated life models, the new model is proposed, which is a new acceleration method for Predicting the lifetime of Microcapsule Electrophoretic Display Device, and the feasibility of this model has been theoretically confirmed.
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