Abstract
High temperature heat treatment of internal Ni electrode and BaTiO 3 dielectric layers is one of the important steps in the sintering process of multilayer ceramic capacitors (MLCCs). In this study, microstructural analysis of partially oxidized Ni electrode in dielectric layers was conducted. Sub-micrometric NiO scales were found along the interface of Ni/BaTiO 3. In addition, the capacitance, dielectric loss, and isolation resistances of the samples after post-treatment in N 2 atmosphere at 1000 °C for 0–8 h were analyzed. A detailed analysis on the NiO and the discussion on the formation mechanism of NiO are presented in this paper.
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