Abstract
A combination of valence band x-ray photoelectron spectroscopy (VXPS) interpreted by Xα calculations, and x-ray diffraction is discussed as a means of understanding the surface chemistry associated with oxidation and its prevention. The cluster models used to interpret VXPS for oxide systems are discussed, and the spectrum of cuprous oxide is examined in detail. It can be seen that good agreement can be obtained with the valence band spectra of oxidation films and corrosion inhibitor films. Examples are given that show how VXPS can reveal chemical features that cannot be obtained from core x-ray photoelectron spectroscopy.
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