Overcoming test challenges presented by embedded flash memory

Abstract

In providing non-volatile storage, embedded flash memory has emerged as a key component in consumer appliances like DVD players and set top boxes as well as mobile applications including cellular phones, wireless infrastructure, smart cards and automotive systems. Driven by demand for improved cost and reliability, flash memory continues to exploit advanced process technologies, moving toward increased integration with logic to reduce system size and chip count. Even as these technology trends increase test requirements, the average selling price (ASP) for flash devices continues to drop. For flash manufacturers facing shrinking margins, the need for reduced cost-of-test for more highly integrated flash devices has become imperative. By using emerging test strategies for single-insertion test and efficient multi-site techniques, flash manufacturers can achieve greater efficiencies in test time and throughput necessary for testing new flash devices.