Abstract

This paper presents solid-state drives (SSDs) with two high reliability techniques. First, an error-prediction (EP) low-density-parity-check (LDPC) error-correcting code (ECC) that realizes an over 10× extended lifetime. Second, an error-recovery (ER) scheme that decreases the program-disturb error rate and the data-retention error rate by 74% and 56%, respectively.

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