Abstract
In this paper we present an investigation about the out of plane component of the magnetization of Ga-rich sputtered FeGa thin films. To study this magnetic component, we have used magnetometric measurements and magnetic force microscopy combined with a structural characterization by means of x-ray diffractometry. For a more profound analysis, we have examined samples in both, as-grown and annealed state. The out of plane component of the magnetization promotes a magnetic ripple observed by magnetic force microscopy in all the studied samples. To quantitatively monitor the out of plane component of the magnetization, we have used the ratio between the magnetic remanence and the maximum magnetization (Mr/Mmax), i.e. the squareness, measured in the perpendicular hysteresis loops. The experimental results indicate that the out of plane component of the magnetization is reduced upon annealing at a moderate temperature of 400 °C. The experimental results can be understood considering that phase coexistence is the most likely origin for the observed magnetic ripple.
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