Abstract
We have developed an orthopedic process to adjust the length and to sharpen the tip of multiwalled carbon nanotube probes. A nanotube was bridged between a Pt-coated knife-edge and a Pt-coated Si tip under a scanning electron microscope. Introducing an excess current into the bridged nanotube peeled off its shells layer by layer from the outermost one at the center and finally cut it. Then the cut ends were sharpened and the length from the Si tip was adjusted by changing the gap between the knife-edge and Si tip. The length-adjusted and sharpened nanotube probes have been applied to noncontact atomic force microscopy to clarify their advantages.
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