Origin of characteristics differences between top and bottom contact organic thin film transistors

Abstract

The differences in drain current and drain voltage (Id-Vd) characteristics of top and bottom contact organic thin film transistors (OTFTs) are analyzed by an OTFT devices simulator, which makes it possible to derive Id-Vd characteristics, potential distribution, and hole concentration distribution by solving Poisson’s equation and current continuity equation. It is found that the intrinsic characteristics of top contact devices are superior to those of the bottom contact ones, which is usually believed to be due to poor contact characteristics and poor semiconductor quality of bottom contact OTFTs. The mechanism behind the intrinsic characteristics differences is the deficiency of carriers at the source-channel interface, resulting to a very high potential drop, which the bottom contact devices suffer more. Remarkable improvements in drain current are expected by only inserting high carrier concentration region around the source/drain contact area, which totally eliminates the potential drop.