Abstract

We present the local structural properties of ZnO nanorods studied by using extended x‐ray absorption fine structure (EXAFS). Vertically aligned ZnO nanorods were fabricated on Al2O3 substrates by a catalyst free metal organic chemical vapor deposition (MOCVD). The polarized EXAFS measurements on the ZnO nanorods were performed at Zn K‐edge. The polarized EXAFS study revealed that the nanorods had a wurtzite structure, and that there were substantial amount of structural disorders in Zn‐O pairs in the beginning of the nanorod growth. The EXAFS measurements revealed that the orientation‐dependent disorders of the Zn‐O pairs were directly related to the growth mechanism and crystal quality of the ZnO nanorods.

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