Abstract
We have used energy-filtered x-ray photoelectron emission microscopy (XPEEM) andsynchrotron radiation to measure the grain orientation dependence of the work function ofa sintered niobium-doped strontium titanate ceramic. A significant spread in work functionvalues is found. Grain orientation and surface reducing/oxidizing conditions are the mainfactors in determining the work function. Energy-filtered XPEEM looks ideallysuited for analysis of other technologically interesting polycrystalline samples.
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