Orientation dependence of grain-boundary critical currents in YBa2Cu3O7- delta bicrystals.

Abstract

The critical current densities across grain boundaries have been measured as a function of misorientation angle in the basal plane of bicrystals of $\mathrm{Y}{\mathrm{Ba}}_{2}{\mathrm{Cu}}_{3}{\mathrm{O}}_{7\ensuremath{-}\ensuremath{\delta}}$. For small misorientation angles, the ratio of the grain-boundary critical current density to the bulk critical current density is roughly proportional to the inverse of the misorientation angle; for large angles, this ratio saturates to a value of about $\frac{1}{50}$. These results imply that achieving a high degree of texture both normal to and within the basal plane is important for the obtaining of very high critical currents in pure polycrystalline samples.