Abstract
We employ monochromatized electron energy loss spectroscopy to study Ti 3SiC 2 and Ti 3AlC 2. By probing individual grains aligned along different axes in bulk polycrystalline Ti 3SiC 2 and Ti 3AlC 2, this approach enables determination of the anisotropy of the dielectric functions and an estimate of the free-electron lifetime in different orientations. The dielectric functions are characterized by strong interband transitions in the low energy region. The energies plasmon resonance were determined to be ≈ 5 eV and exhibit a strong orientation-dependence. Our measurements show that the free-electron lifetimes are also highly orientation-dependent. These results suggest that scattering of carriers in MAX phases is very sensitive to composition and orientation.
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