Abstract

Lamellar and hexagonal pattern rearrangements in thin films of polystyrene–block–poly(2-vinyl pyridine) and polystyrene–block–poly(4-vinyl pyridine) copolymers simultaneously exposed to an in-plane AC electric field and saturated chloroform vapor are studied with atomic force microscopy and analyzed via the numerical solution of the self-consistent field theory equations. It is demonstrated that the use of AC field with the root-mean-square strength higher than 8 V⋅μm−1 allows one to effectively orient microphase-separated domains along the field direction on the tens of microns scale. At the same time, the AC field considerably lowers the risk of breakdown and eliminates effects related to ionic transport in the presence of solvent vapor. The role of such factors as the exposure time, field strength and frequency is investigated. Theoretical considerations prove the equivalent effect of AC and DC fields on the structure of the copolymer film in a wide frequency range. Self-consistent field theory calculations of the free energy as a function of film thickness make it possible to exactly identify which phase dominates in the film. In particular, an apparent transformation of standing cylinders into long threads aligned in the field direction should be interpreted as the phase transition from the perpendicular to parallel hexagonal phase, which can take place in a certain range of film thicknesses, provided the electric field strength exceeds a certain threshold value. In the case of a perpendicular lamellar phase, the domain orientation along the direction of the electric field is always profitable. The observed morphological rearrangements under an in-plane field, which preserve connectivity between the film surfaces through the domains of the minor copolymer block, can be important for practical applications.

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