Optogalvanic Properties of the Ion Guide Source in the Recoil Nucleus Selective Photoionization

Abstract

This consideration is a conjunction of two processes: generation of recoil products and selective detection. A new type of plasma is carried out. The electron energy function distribution of the ion-guide source plasma is calculated and discussed. The properties of a laser ionization scheme detecting recoil atoms are analyzed using an optogalvanic approach. The Resonant Laser Ionization (RLI) in low temperature currentless plasma, formed by accelerated particle beam propagating through gas, will be used for the above mentioned separation. A tuned dye laser excites the studied atoms and the fast electrons ionize them. This process exceeds in cross-section the ionization from ground state which provides selectivity of IGS. The latter produces ions of almost all chemical elements. It can be used for investigating processes flowing in low temperature currentless plasma which presents a specific interest. These functions impart to the IGS the role of an Optogalvanic (OG) element, to be precise, of hollow cathode discharge used as an OG detector [1]. In this paper the IGS is analyzed as an OG detector in a quasi OG scheme. The investigation is a step simulating the IGS properties. The Electron Energy Distribution Function (EEDF) and the most important processes are analyzed and discussed as a first step in this field. The results obtained contribute to the efficiency of the RLI method.