Abstract
This paper presents the optoelectronic complex, which provides both preparations for carrying out an express lifetime prediction of edge emitted strip single-mode laser diodes. It is shown that for this purpose the complex should consist of four operational units: an input control unit; a spectral radiation characteristics measurement unit; a laser lifetime forecasting unit and automatic processing hardware unit. The use of this complex makes it possible to predict the lifetime of a laser diode according to their spectral characteristics at the initial stage of its operation.
Highlights
According to this concept, there was developed an optoelectronic complex, consisting of four operational units
The concept used in the design of the optoelectronic complex is based on the necessity for measurements and numerical analysis of laser diodes (LD) radiation pattern and spectrum at the initial stage of their operation
LD specimen is rejected, if after testing in climate control chamber (CCC) the radiation power is reduced by not less than 10% compared to the power at switching for the first time
Summary
The concept used in the design of the optoelectronic complex is based on the necessity for measurements and numerical analysis of laser diodes (LD) radiation pattern and spectrum at the initial stage of their operation. There was developed an optoelectronic complex, consisting of four operational units. Three of them provide full-scale measurements of space-power, spectral parameters and radiation characteristics of LD.
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