Abstract
Because of continual improvement in manufacturing design, one often deals with high quality products that are highly reliable with a substantially long life span. This article discusses k-level step-stress partially accelerated tests under type I progressive interval censoring with equal inspection intervals of length τ. It is assumed that the lifetime of a testing unit follows a Weibull distribution. The problem of choosing the optimal τ is considered according to a certain optimality criterion. Two selection criteria that enable us to obtain the optimum test plans are investigated. Monte Carlo simulations are presented to illustrate the proposed methods.
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