Abstract

We present results of niobium based SQUID magnetometers for which the weak links areengineered by the local oxidation of thin films using an atomic force microscope (AFM).Firstly, we show that this technique allows the creation of variable thickness bridges with10 nm lateral resolution. Precise control of the weak link milling is offered by the possibilityto monitor, in real-time, the weak link conductance. Such a process is shown to enhance themagnetic field modulation and hence the sensitivity of the magnetometer. Secondly, AFMlithography is used to provide a precise alignment of nanoSQUID weak links withrespect to a ferromagnetic iron dot. The magnetization switching of the near-fieldcoupled particle is studied as a function of the applied magnetic field direction.

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