Abstract
Verification of semiconductor chip designs is commonly driven by single goal orientated measures. With increasing design complexities, this approach is no longer effective. We enhance the effectiveness of coverage driven design verifications by applying multi-objective optimization techniques. The technique is based on genetic evolutionary algorithms. Difficulties with conflicting test objectives and selection of tests to achieve multiple verification goals in the genetic evolutionary framework are also addressed.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Industrial & Management Optimization
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
