Abstract
NMOS-based power-rail ESD clamp circuits with gate-driven mechanism have been widely used to obtain the desired ESD protection ability. All of them are based on a similar circuit scheme with 3-stage inverters to drive the ESD clamp NMOS transistor with large device dimension. In this work, the designs with 3-stage-inverter and 1-stage-inverter controlling circuits have been studied to verify the optimal circuit schemes in NMOS-based power-rail ESD clamp circuits.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
